Surface Characterization Center of Solid State Institute

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The Surface Science Laboratory serves as a center for basic and applied research in the field of surface science.

Established in 1980 it has contributed to the research of hundreds of academic teams and industrial companies in a variety of fields from classical materials engineering, chemistry and physics to modern microelectronics, nanoparticles, and quantum computing.

Academic supervisor: Prof. David Gershoni, dg@physics.technion.ac.il

Available services:

XPS - X-ray Photoelectron Spectroscopy (VersaProbeIII by PHI)

Contact person: Dr. Kamira Weinfeld, kamira@si.technion.ac.il

Phone : 04 -829-5638/ 3421

TOF-SIMS- Time of Flight Secondary Ion Mass Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS5 by Iontof)

Contact person: Dr. Shaul Michaelson, mshaul@si.technion.ac.il

Phone: 04-829-3148

STM/AFM - Scanning Tunneling/Atomic Force Microscopy (Omicron UHV SPM), Kelvin prop force microscopy

Contact person: Dr. Cecile Saguy, cecile@sspower.technion.ac.il

Phone: 04 -829-3547