Variable Temperature, Ultra High Vacuum, Scanning Probe Microscope (VT-UHVSPM)

Contact: Dr. Cecile Saguy

Tel: +972-4-829-3547

e-mail: cecile@si.technion.ac.il

afm

The Laboratory is based on an Omicron Variable Temperature Ultra High Vacuum Scanning Probe Microscope system, purchased in 2005.

It includes an Atomic Force Microscope (AFM) and a Scanning Tunneling Microscope (STM)

The key features are:

- True sub-pA scanning tunneling microscopy and spectroscopy (STS)

- STS down to atomic scale

- True atomic resolution imaging in contact AFM mode

- Topography and Current mapping in contact AFM mode

- Non-contact AFM mode in frequency modulation regime and new PLL electronics

- Scanning Kelvin Probe Microscopy (SKPM) in frequency modulation regime

- In situ Auger electron spectroscopy (AES), - In situ low energy electron diffraction (LEED),

- In situ cleavage, - In situ Ar sputtering,

- In situ metal evaporation and In situ H2 cracker

- Gate valve for analysis and preparation chamber isolation

- AFM beam deflection

- Direct and radiation sample heating up to 1500K

- In situ cooling and heating down to 25K and up to 1500K

- Scan size from sub-nano to 8 µm